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geant4/source/processes/electromagnetic/lowenergy/include/G4MicroElecElasticModel_new.hh
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//
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//
//
// G4MicroElecElasticModel_new.hh, 2011/08/29 A.Valentin, M. Raine are with CEA [a]
// 2020/05/20 P. Caron, C. Inguimbert are with ONERA [b]
// Q. Gibaru is with CEA [a], ONERA [b] and CNES [c]
// M. Raine and D. Lambert are with CEA [a]
//
// A part of this work has been funded by the French space agency(CNES[c])
// [a] CEA, DAM, DIF - 91297 ARPAJON, France
// [b] ONERA - DPHY, 2 avenue E.Belin, 31055 Toulouse, France
// [c] CNES, 18 av.E.Belin, 31401 Toulouse CEDEX, France
//
// Based on the following publications
// - A.Valentin, M. Raine,
// Inelastic cross-sections of low energy electrons in silicon
// for the simulation of heavy ion tracks with the Geant4-DNA toolkit,
// NSS Conf. Record 2010, pp. 80-85
// https://doi.org/10.1109/NSSMIC.2010.5873720
//
// - A.Valentin, M. Raine, M.Gaillardin, P.Paillet
// Geant4 physics processes for microdosimetry simulation:
// very low energy electromagnetic models for electrons in Silicon,
// https://doi.org/10.1016/j.nimb.2012.06.007
// NIM B, vol. 288, pp. 66-73, 2012, part A
// heavy ions in Si, NIM B, vol. 287, pp. 124-129, 2012, part B
// https://doi.org/10.1016/j.nimb.2012.07.028
//
// - M. Raine, M. Gaillardin, P. Paillet
// Geant4 physics processes for silicon microdosimetry simulation:
// Improvements and extension of the energy-range validity up to 10 GeV/nucleon
// NIM B, vol. 325, pp. 97-100, 2014
// https://doi.org/10.1016/j.nimb.2014.01.014
//
// - J. Pierron, C. Inguimbert, M. Belhaj, T. Gineste, J. Puech, M. Raine
// Electron emission yield for low energy electrons:
// Monte Carlo simulation and experimental comparison for Al, Ag, and Si
// Journal of Applied Physics 121 (2017) 215107.
// https://doi.org/10.1063/1.4984761
//
// - P. Caron,
// Study of Electron-Induced Single-Event Upset in Integrated Memory Devices
// PHD, 16th October 2019
//
// - Q.Gibaru, C.Inguimbert, P.Caron, M.Raine, D.Lambert, J.Puech,
// Geant4 physics processes for microdosimetry and secondary electron emission simulation :
// Extension of MicroElec to very low energies and new materials
// NIM B, 2020, in review.
//
//
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#ifndef G4MICROELECELASTICMODEL_NEW_HH
#define G4MICROELECELASTICMODEL_NEW_HH 1
#include <map>
#include <CLHEP/Units/SystemOfUnits.h>
#include "G4MicroElecMaterialStructure.hh"
#include "G4MicroElecCrossSectionDataSet_new.hh"
#include "G4VEmModel.hh"
#include "G4Electron.hh"
#include "G4ParticleChangeForGamma.hh"
#include "G4LogLogInterpolation.hh"
#include "G4ProductionCutsTable.hh"
#include "G4NistManager.hh"
class G4MicroElecElasticModel_new : public G4VEmModel
{
public:
G4MicroElecElasticModel_new(const G4ParticleDefinition* p = 0,
const G4String& nam = "MicroElecElasticModel");
~G4MicroElecElasticModel_new() override;
void Initialise(const G4ParticleDefinition*, const G4DataVector&) override;
G4double CrossSectionPerVolume(const G4Material* material,
const G4ParticleDefinition* p,
G4double ekin,
G4double emin,
G4double emax) override;
G4double AcousticCrossSectionPerVolume(G4double ekin, G4double kbz, G4double rho,
G4double cs, G4double Aac, G4double Eac,
G4double prefactor);
void SampleSecondaries(std::vector<G4DynamicParticle*>*,
const G4MaterialCutsCouple*,
const G4DynamicParticle*,
G4double tmin,
G4double maxEnergy) override;
void SetKillBelowThreshold (G4double threshold);
G4double GetKillBelowThreshold () { return killBelowEnergy; }
G4double DamageEnergy(G4double T,G4double A, G4double Z);
protected:
G4ParticleChangeForGamma* fParticleChangeForGamma;
private:
G4MicroElecElasticModel_new & operator=(const G4MicroElecElasticModel_new &right);
G4MicroElecElasticModel_new(const G4MicroElecElasticModel_new&);
// Final state
G4double Theta(G4ParticleDefinition * aParticleDefinition, G4double k, G4double integrDiff);
G4double LinLinInterpolate(G4double e1, G4double e2, G4double e, G4double xs1, G4double xs2);
G4double LogLogInterpolate(G4double e1, G4double e2, G4double e, G4double xs1, G4double xs2);
G4double LinLogInterpolate(G4double e1, G4double e2, G4double e, G4double xs1, G4double xs2);
G4double QuadInterpolator(G4double e11, G4double e12, G4double e21, G4double e22,
G4double x11, G4double x12, G4double x21, G4double x22,
G4double t1, G4double t2, G4double t, G4double e);
G4double RandomizeCosTheta(G4double k);
G4Material* nistSi = nullptr;
G4double killBelowEnergy;
G4double lowEnergyLimit;
G4double lowEnergyLimitOfModel;
G4double highEnergyLimit;
G4bool isInitialised;
G4int verboseLevel;
// Cross section
typedef std::map<G4String,G4String,std::less<G4String> > MapFile;
MapFile tableFile;
typedef std::map<G4String,G4MicroElecCrossSectionDataSet_new*,std::less<G4String> > MapData;
//MapData tableData;
typedef std::map<G4String, MapData*, std::less<G4String> > TCSMap;
TCSMap tableTCS;
//Maps for multilayers
typedef std::map<G4double, std::map<G4double, G4double> > TriDimensionMap;
typedef std::map<G4String, TriDimensionMap* > ThetaMap;
ThetaMap thetaDataStorage; //Storage of angles (cumulated)
typedef std::map<G4String, std::vector<G4double>* > energyMap;
energyMap eIncidentEnergyStorage;
typedef std::map<G4double, std::vector<G4double> > VecMap;
typedef std::map<G4String, VecMap* > ProbaMap;
ProbaMap eProbaStorage; //Storage of probabilities for cumulated sections
typedef std::map<G4String, G4MicroElecMaterialStructure*, std::less<G4String> > MapStructure;
MapStructure tableMaterialsStructures; //Structures of all materials simulated
G4MicroElecMaterialStructure* currentMaterialStructure = nullptr;
typedef std::map<G4String, G4double, std::less<G4String> > MapEnergy;
MapEnergy lowEnergyLimitTable;
MapEnergy highEnergyLimitTable;
MapEnergy workFunctionTable;
G4bool killElectron, acousticModelEnabled;
G4String currentMaterialName;
G4bool isOkToBeInitialised;
};
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#endif